EDN

Optimizing compression in scan-based ATPG DFT implementations

In the 1990s, Carnegie Mellon researchers created a comprehensive scan-test cost model that demonstrated how design for test (DFT) contributes to profitability (Ref. 1). With scan compression in wide ...
Computerworld

Xerox scanners found to sometimes alter numbers

Xerox scanners have been found to randomly alter numbers on documents when reproducing them if a certain combination of image quality and compression setting is used. The problem first came to light ...
Electronic Design

The Benefits—And Hazards—Of Scan Compression

IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...
Electronic Design

Scan ATPG and compression are beating Moore’s law

Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...
Design-Reuse

Next Gen Scan Compression Technique to overcome Test challenges at Lower Technology Nodes (Part - I)

We live in an era where the demand for portable and wearable devices have been increasing multifold. Products based on applications like IoT (Internet of Things), Artificial Intelligence, Virtual ...