No part of a product life cycle is immune to time-to-market pressures, and that includes wafer-level parametric tests on scribe-line test structures. Parallel parametric test is emerging as a ...

Parallel test is a surefire method for speeding up production, and asynchronous parallel test has long been known as an effective way of significantly improving through-put while making the most of ...

January 23, 2014. Keithley Instruments Inc. has introduced the latest upgrades to its S530 Parametric Test Systems for high-speed production parametric test of semiconductors. These enhancements ...